"On Low-Capture-Power Test Generation for Scan Testing."

Xiaoqing Wen et al. (2005)

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DOI: 10.1109/VTS.2005.60

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/WenYKWSK05
Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita:
On Low-Capture-Power Test Generation for Scan Testing. VTS 2005: 265-270

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