"Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations."

R. D. (Shawn) Blanton et al. (2012)

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DOI: 10.1109/MDT.2011.2178587

access: closed

type: Journal Article

metadata version: 2020-05-17

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R. D. (Shawn) Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku:
Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations. IEEE Des. Test Comput. 29(1): 36-47 (2012)

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