"Compact Modeling of Variation in FinFET SRAM Cells."

Darsen D. Lu et al. (2010)

> Home

Details and statistics

DOI: 10.1109/MDT.2010.39

access: closed

type: Journal Article

metadata version: 2023-06-26

- view
  authority control:
- export record
  dblp key:
  - journals/dt/LuLNH10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/LuLNH10
Darsen D. Lu, Chung-Hsun Lin, Ali M. Niknejad, Chenming Hu:
Compact Modeling of Variation in FinFET SRAM Cells. IEEE Des. Test Comput. 27(2): 44-50 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.