"IC Failure Analysis: Magic, Mystery, and Science."

Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson (1997)

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DOI: 10.1109/54.605998

access: closed

type: Journal Article

metadata version: 2020-05-17

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Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson:
IC Failure Analysis: Magic, Mystery, and Science. IEEE Des. Test Comput. 14(3): 59-69 (1997)

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