"Special Issue on Testability and Dependability of Artificial Intelligence ..."

Fei Su, Chunsheng Liu, Haralampos-G. Stratigopoulos (2023)

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DOI: 10.1109/MDAT.2023.3241114

access: closed

type: Journal Article

metadata version: 2023-03-28

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Fei Su, Chunsheng Liu, Haralampos-G. Stratigopoulos:
Special Issue on Testability and Dependability of Artificial Intelligence Hardware. IEEE Des. Test 40(2): 5-7 (2023)

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