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"Changing Test and Data Modeling Requirements for Screening Latent Defects ..."

Ritesh P. Turakhia et al. (2006)

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DOI: 10.1109/MDT.2006.37

access: closed

type: Journal Article

metadata version: 2020-05-17

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  - journals/dt/TurakhiaDLB06
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  - https://dblp.org/rec/journals/dt/TurakhiaDLB06
Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware:
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Des. Test Comput. 23(2): 100-109 (2006)

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