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"Defect propagation at the project-level: results and a post-hoc analysis ..."

Padmal Vitharana (2017)

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DOI: 10.1007/S10664-015-9415-3

access: closed

type: Journal Article

metadata version: 2020-08-25

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Padmal Vitharana:
Defect propagation at the project-level: results and a post-hoc analysis on inspection efficiency. Empir. Softw. Eng. 22(1): 57-79 (2017)

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