"Test Set Compression Through Alternation Between Deterministic and ..."

Ahmad A. Al-Yamani, Edward J. McCluskey (2010)

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DOI: 10.1007/S10836-010-5172-9

access: closed

type: Journal Article

metadata version: 2020-09-11

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Ahmad A. Al-Yamani, Edward J. McCluskey:
Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test Patterns. J. Electron. Test. 26(5): 513-521 (2010)

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