"Test and Reliability in Approximate Computing."

Lorena Anghel et al. (2018)

> Home

Details and statistics

DOI: 10.1007/S10836-018-5734-9

access: closed

type: Journal Article

metadata version: 2024-11-08

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/AnghelBBTV18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/AnghelBBTV18
Lorena Anghel, Mounir Benabdenbi, Alberto Bosio, Marcello Traiola, Elena-Ioana Vatajelu:
Test and Reliability in Approximate Computing. J. Electron. Test. 34(4): 375-387 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.