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"Improve the Quality of Per-Test Fault Diagnosis Using Output Information."

Chunsheng Liu (2007)

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DOI: 10.1007/S10836-006-9442-5

access: closed

type: Journal Article

metadata version: 2020-09-11

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Chunsheng Liu:
Improve the Quality of Per-Test Fault Diagnosis Using Output Information. J. Electron. Test. 23(1): 11-24 (2007)

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