"Built-in Self Test of RF Subsystems with Integrated Detectors."

Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham (2012)

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DOI: 10.1007/S10836-012-5315-2

access: closed

type: Journal Article

metadata version: 2020-09-11

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Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham:
Built-in Self Test of RF Subsystems with Integrated Detectors. J. Electron. Test. 28(5): 557-569 (2012)

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