"A test pattern generation method with high compression ratio."

Feng Liang, Luwen Zhang, Shaochong Lei (2011)

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DOI: 10.1587/ELEX.8.1842

access: open

type: Journal Article

metadata version: 2021-02-12

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  - journals/ieiceee/LiangZL11
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  - https://dblp.org/rec/journals/ieiceee/LiangZL11
Feng Liang, Luwen Zhang, Shaochong Lei:
A test pattern generation method with high compression ratio. IEICE Electron. Express 8(21): 1842-1847 (2011)

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