"Radiation-enhanced channel length modulation induced by trapped charges in ..."

Xin Xie et al. (2019)

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DOI: 10.1587/ELEX.16.20190454

access: open

type: Journal Article

metadata version: 2021-02-12

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Xin Xie, Huilong Zhu, Mengying Zhang, Dawei Bi, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou:
Radiation-enhanced channel length modulation induced by trapped charges in buried oxide layer. IEICE Electron. Express 16(21): 20190454 (2019)

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