"On Embedding Test Patterns into Low-Power Bist Sequences."

Ioannis Voyiatzis (2008)

> Home

Details and statistics

DOI: 10.1080/08874417.2009.11646049

access: closed

type: Journal Article

metadata version: 2020-04-16

- view
  - electronic edition @ tandfonline.com
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jcis/Voyiatzis08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jcis/Voyiatzis08
Ioannis Voyiatzis:
On Embedding Test Patterns into Low-Power Bist Sequences. J. Comput. Inf. Syst. 49(2): 58-64 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.