"A new method for in situ measurement of parameters and degradation ..."

Petr Pfeifer, Zdenek Plíva (2014)

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DOI: 10.1016/J.MICPRO.2014.04.008

access: closed

type: Journal Article

metadata version: 2020-02-22

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Petr Pfeifer, Zdenek Plíva:
A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devices. Microprocess. Microsystems 38(6): 605-619 (2014)

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