"Electrical characteristics and modelling of multi-island single-electron ..."

Aimen Boubaker et al. (2009)

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DOI: 10.1016/J.MEJO.2008.06.089

access: closed

type: Journal Article

metadata version: 2024-01-25

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Aimen Boubaker, M. Troudi, Nabil Sghaier, A. Souifi, Nicolas Baboux, A. Kalboussi:
Electrical characteristics and modelling of multi-island single-electron transistor using SIMON simulator. Microelectron. J. 40(3): 543-546 (2009)

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