"An all-digital built-in-self-test scheme for duty cycle corrector with ..."

Ya Hai et al. (2023)

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DOI: 10.1016/J.MEJO.2023.105947

access: closed

type: Journal Article

metadata version: 2023-11-28

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Ya Hai, Fei Liu, Yongshan Wang, Jing Kang:
An all-digital built-in-self-test scheme for duty cycle corrector with de-skew circuit in NAND Flash memory. Microelectron. J. 141: 105947 (2023)

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