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"VLSI test through an improved LDA classification algorithm for test cost ..."

Liang Huang, Tai Song (2022)

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DOI: 10.1016/J.MEJO.2022.105461

access: closed

type: Journal Article

metadata version: 2022-12-07

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Liang Huang, Tai Song:
VLSI test through an improved LDA classification algorithm for test cost reduction. Microelectron. J. 125: 105461 (2022)

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