"Characterization and modelling of single event transients in LDMOS-SOI FETs."

Joaquín Alvarado et al. (2011)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2011.07.082

access: closed

type: Journal Article

metadata version: 2021-10-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/AlvaradoKBF11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/AlvaradoKBF11
Joaquín Alvarado, Valeria Kilchytska, El Hafed Boufouss, Denis Flandre:
Characterization and modelling of single event transients in LDMOS-SOI FETs. Microelectron. Reliab. 51(9-11): 2004-2009 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.