"Study of a failure mechanism during UIS switching of planar PT-IGBT with ..."

Giovanni Breglio et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.009

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type: Journal Article

metadata version: 2024-08-28

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Giovanni Breglio, Andrea Irace, Ettore Napoli, Paolo Spirito, Kimimori Hamada, T. Nishijima, T. Ueta:
Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell. Microelectron. Reliab. 47(9-11): 1756-1760 (2007)

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