"Statistical aspects of reliability in bulk MOSFETs with multiple defect ..."

Muhammad Faiz Bukhori, Scott Roy, Asen Asenov (2008)

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DOI: 10.1016/J.MICROREL.2008.06.029

access: closed

type: Journal Article

metadata version: 2020-02-22

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Muhammad Faiz Bukhori, Scott Roy, Asen Asenov:
Statistical aspects of reliability in bulk MOSFETs with multiple defect states and random discrete dopants. Microelectron. Reliab. 48(8-9): 1549-1552 (2008)

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