"Voltage acceleration of time dependent breakdown of ultra-thin NO and NON ..."

Peter Hofmann (2008)

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DOI: 10.1016/J.MICROREL.2008.06.014

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type: Journal Article

metadata version: 2020-02-22

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Peter Hofmann:
Voltage acceleration of time dependent breakdown of ultra-thin NO and NON dielectrics. Microelectron. Reliab. 48(8-9): 1189-1192 (2008)

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