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"Failure modes and mechanism analysis of SiC MOSFET under short-circuit ..."

Xi Jiang et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.101

access: closed

type: Journal Article

metadata version: 2023-08-04

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Xi Jiang, Jun Wang, Jiwu Lu, Jianjun Chen, Xin Yang, Zongjian Li, Chunming Tu, Zheng John Shen:
Failure modes and mechanism analysis of SiC MOSFET under short-circuit conditions. Microelectron. Reliab. 88-90: 593-597 (2018)

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