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"Enhanced finite element modelling of Cu electromigration using ANSYS and ..."

Wei Li, Cher Ming Tan (2007)

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DOI: 10.1016/J.MICROREL.2007.07.058

access: closed

type: Journal Article

metadata version: 2020-02-22

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Wei Li, Cher Ming Tan:
Enhanced finite element modelling of Cu electromigration using ANSYS and matlab. Microelectron. Reliab. 47(9-11): 1497-1501 (2007)

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