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"Degradation behaviors of GaN light-emitting diodes under high-temperature ..."

J. Liu et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.09.014

access: closed

type: Journal Article

metadata version: 2023-03-11

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J. Liu, Hei Wong, Sik-Lam Siu, Chi-Wah Kok, Valeriu Filip:
Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing. Microelectron. Reliab. 52(8): 1636-1639 (2012)

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