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"Applications of TEM imaging, analysis and electron holography to ..."

David J. Smith et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.155

access: closed

type: Journal Article

metadata version: 2020-10-26

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David J. Smith, David A. Cullen, Lin Zhou, Martha R. McCartney:
Applications of TEM imaging, analysis and electron holography to III-nitride HEMT devices. Microelectron. Reliab. 50(9-11): 1514-1519 (2010)

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