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"Applications of finite element methods for reliability study of ULSI ..."

Cher Ming Tan, Wei Li, Zhenghao Gan (2012)

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DOI: 10.1016/J.MICROREL.2011.09.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Cher Ming Tan, Wei Li, Zhenghao Gan:
Applications of finite element methods for reliability study of ULSI interconnections. Microelectron. Reliab. 52(8): 1539-1545 (2012)

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