"An approach to statistical analysis of gate oxide breakdown mechanisms."

Cher Ming Tan, Nagarajan Raghavan (2007)

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DOI: 10.1016/J.MICROREL.2007.07.011

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type: Journal Article

metadata version: 2023-03-21

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Cher Ming Tan, Nagarajan Raghavan:
An approach to statistical analysis of gate oxide breakdown mechanisms. Microelectron. Reliab. 47(9-11): 1336-1342 (2007)

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