"Defect-centric perspective of time-dependent BTI variability."

Maria Toledano-Luque et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.120

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/Toledano-LuqueKFRGG12
Maria Toledano-Luque, Ben Kaczer, Jacopo Franco, Philippe Roussel, Tibor Grasser, Guido Groeseneken:
Defect-centric perspective of time-dependent BTI variability. Microelectron. Reliab. 52(9-10): 1883-1890 (2012)

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