"Influence of the interface trap location on the performance and ..."

V. Velayudhan et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.052

access: closed

type: Journal Article

metadata version: 2020-12-29

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V. Velayudhan, Francisco Gámiz, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich:
Influence of the interface trap location on the performance and variability of ultra-scaled MOSFETs. Microelectron. Reliab. 53(9-11): 1243-1246 (2013)

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