"The Perils and Pitfalls of Block Design for EEG Classification Experiments."

Ren Li et al. (2021)

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DOI: 10.1109/TPAMI.2020.2973153

access: open

type: Journal Article

metadata version: 2023-07-27

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  - https://dblp.org/rec/journals/pami/LiJAIWBS21
Ren Li, Jared S. Johansen, Hamad Ahmed, Thomas V. Ilyevsky, Ronnie B. Wilbur, Hari M. Bharadwaj, Jeffrey Mark Siskind:
The Perils and Pitfalls of Block Design for EEG Classification Experiments. IEEE Trans. Pattern Anal. Mach. Intell. 43(1): 316-333 (2021)

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