"Distance metric learning for pattern recognition."

Jiwen Lu et al. (2018)

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DOI: 10.1016/J.PATCOG.2017.10.032

access: closed

type: Journal Article

metadata version: 2021-04-09

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Jiwen Lu, Ruiping Wang, Ajmal S. Mian, Ajay Kumar, Sudeep Sarkar:
Distance metric learning for pattern recognition. Pattern Recognit. 75: 1-3 (2018)

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