"Efficient Algorithms for Testing Semiconductor Random-Access Memories."

Ravindra Nair, Satish M. Thatte, Jacob A. Abraham (1978)

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DOI: 10.1109/TC.1978.1675150

access: closed

type: Journal Article

metadata version: 2017-05-20

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Ravindra Nair, Satish M. Thatte, Jacob A. Abraham:
Efficient Algorithms for Testing Semiconductor Random-Access Memories. IEEE Trans. Computers 27(6): 572-576 (1978)

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