"Metal-Density-Driven Placement for CMP Variation and Routability."

Tung-Chieh Chen et al. (2008)

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DOI: 10.1109/TCAD.2008.2006148

access: closed

type: Journal Article

metadata version: 2020-09-24

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Tung-Chieh Chen, Minsik Cho, David Z. Pan, Yao-Wen Chang:
Metal-Density-Driven Placement for CMP Variation and Routability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(12): 2145-2155 (2008)

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