"ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults."

Sunghoon Chun, Taejin Kim, Sungho Kang (2009)

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DOI: 10.1109/TCAD.2009.2028165

access: closed

type: Journal Article

metadata version: 2020-09-24

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Sunghoon Chun, Taejin Kim, Sungho Kang:
ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(9): 1401-1413 (2009)

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