"Inductive fault analysis of surface-micromachined MEMS."

Tao Jiang, R. D. (Shawn) Blanton (2006)

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DOI: 10.1109/TCAD.2005.855926

access: closed

type: Journal Article

metadata version: 2023-11-22

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Tao Jiang, R. D. (Shawn) Blanton:
Inductive fault analysis of surface-micromachined MEMS. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(6): 1104-1116 (2006)

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