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"Failing vector identification based on overlapping intervals of test ..."

Chunsheng Liu, Krishnendu Chakrabarty (2003)

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DOI: 10.1109/TCAD.2003.810739

access: closed

type: Journal Article

metadata version: 2022-01-03

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Chunsheng Liu, Krishnendu Chakrabarty:
Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(5): 593-604 (2003)

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