"Black-Box Test-Cost Reduction Based on Bayesian Network Models."

Renjian Pan et al. (2021)

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DOI: 10.1109/TCAD.2020.2994257

access: closed

type: Journal Article

metadata version: 2022-01-03

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Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Black-Box Test-Cost Reduction Based on Bayesian Network Models. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(2): 386-399 (2021)

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