"EBIST: a novel test generator with built-in fault detection capability."

Dhiraj K. Pradhan, Chunsheng Liu (2005)

> Home

Details and statistics

DOI: 10.1109/TCAD.2005.850815

access: closed

type: Journal Article

metadata version: 2020-09-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/PradhanL05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/PradhanL05
Dhiraj K. Pradhan, Chunsheng Liu:
EBIST: a novel test generator with built-in fault detection capability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(9): 1457-1466 (2005)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.