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"Scan-based transition test."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Jacob Savir, Srinivas Patil (1993)

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DOI: 10.1109/43.238615

access: closed

type: Journal Article

metadata version: 2020-09-24

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  dblp key:
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  - https://dblp.org/rec/journals/tcad/SavirP93
Jacob Savir, Srinivas Patil:
Scan-based transition test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(8): 1232-1241 (1993)

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