"Power Supply Noise Reduction for At-Speed Scan Testing in ..."

Meng-Fan Wu et al. (2009)

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DOI: 10.1109/TCAD.2009.2030440

access: closed

type: Journal Article

metadata version: 2020-09-24

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Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase:
Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(11): 1767-1776 (2009)

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