"Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal ..."

Byoungho Kim, Jacob A. Abraham (2014)

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DOI: 10.1109/TCSII.2014.2335436

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type: Journal Article

metadata version: 2020-05-27

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Byoungho Kim, Jacob A. Abraham:
Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal Embedded Circuits. IEEE Trans. Circuits Syst. II Express Briefs 61-II(10): 743-747 (2014)

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