"A Scalable Model for Snapback Characteristics of Circuit-Level ESD Simulation."

Zilong Shen et al. (2022)

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DOI: 10.1109/TCSII.2021.3123838

access: closed

type: Journal Article

metadata version: 2022-04-01

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Zilong Shen, Yize Wang, Yunhao Li, Xing Zhang, Yuan Wang:
A Scalable Model for Snapback Characteristics of Circuit-Level ESD Simulation. IEEE Trans. Circuits Syst. II Express Briefs 69(3): 1547-1551 (2022)

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