"Deep Models for Engagement Assessment With Scarce Label Information."

Feng Li et al. (2017)

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DOI: 10.1109/THMS.2016.2608933

access: closed

type: Journal Article

metadata version: 2024-01-16

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Feng Li, Guangfan Zhang, Wei Wang, Roger Xu, Tom Schnell, Jonathan Wen, Frederic D. McKenzie, Jiang Li:
Deep Models for Engagement Assessment With Scarce Label Information. IEEE Trans. Hum. Mach. Syst. 47(4): 598-605 (2017)

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