"A comparison among different setups for measuring on-wafer integrated ..."

Jaime Aguilera et al. (2002)

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DOI: 10.1109/TIM.2002.1017719

access: closed

type: Journal Article

metadata version: 2020-06-08

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Jaime Aguilera, G. Matias, Joaquín de No, Andrés Garcia-Alonso, Roc Berenguer:
A comparison among different setups for measuring on-wafer integrated inductors in RF applications. IEEE Trans. Instrum. Meas. 51(3): 487-491 (2002)

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