"Surface layer impurities on silicon spheres used in determination of the ..."

Michael J. Kenny et al. (1999)

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DOI: 10.1109/19.769571

access: closed

type: Journal Article

metadata version: 2020-06-08

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Michael J. Kenny, Roger P. Netterfield, Leszek S. Wielunski, David Beaglehole:
Surface layer impurities on silicon spheres used in determination of the Avogadro constant. IEEE Trans. Instrum. Meas. 48(2): 233-237 (1999)

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