"Compressed Sensing for Surface Characterization and Metrology."

Jianwei Ma (2010)

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DOI: 10.1109/TIM.2009.2027744

access: closed

type: Journal Article

metadata version: 2020-06-08

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Jianwei Ma:
Compressed Sensing for Surface Characterization and Metrology. IEEE Trans. Instrum. Meas. 59(6): 1600-1615 (2010)

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