"Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters."

Jason Wibbenmeyer, Chien-In Henry Chen (2007)

> Home

Details and statistics

DOI: 10.1109/TIM.2007.908343

access: closed

type: Journal Article

metadata version: 2020-06-08

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/WibbenmeyerC07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/WibbenmeyerC07
Jason Wibbenmeyer, Chien-In Henry Chen:
Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters. IEEE Trans. Instrum. Meas. 56(6): 2748-2756 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.