"Test Path Selection for Capturing Delay Failures Under Statistical Timing ..."

Zijian He et al. (2013)

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DOI: 10.1109/TVLSI.2012.2208661

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type: Journal Article

metadata version: 2023-05-11

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Zijian He, Tao Lv, Huawei Li, Xiaowei Li:
Test Path Selection for Capturing Delay Failures Under Statistical Timing Model. IEEE Trans. Very Large Scale Integr. Syst. 21(7): 1210-1219 (2013)

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