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2020 – today
- 2024
[c9]Jenna B. Kronenberg, Yoni Xiong, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva:
Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages. IRPS 2024: 1-5- [c8]Nicholas J. Pieper, M. Chun, Yoni Xiong, H. M. Dattilo, Jenna B. Kronenberg, Sanghyeon Baeg, Shi-Jie Wen, Rita Fung, D. Chan, C. Escobar, Bharat L. Bhuva:
Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems. IRPS 2024: 1-7 - [c7]Yoni Xiong, Nicholas J. Pieper, Jenna B. Kronenberg, Dennis R. Ball, Megan Casey, Bharat L. Bhuva:
Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node. IRPS 2024: 46 - 2023
- [c6]Nicholas J. Pieper, Yoni Xiong, Dennis R. Ball, J. Pasternak, Bharat L. Bhuva:
Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node. IRPS 2023: 1-6 - [c5]Yoni Xiong, Yueh Chiang
, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva:
Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology. IRPS 2023: 1-6 - 2022
- [c4]Nicholas J. Pieper, Yoni Xiong, Alexandra Feeley, Dennis R. Ball, Bharat L. Bhuva:
Single-Event Latchup Vulnerability at the 7-nm FinFET Node. IRPS 2022: 5 - [c3]Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva:
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. IRPS 2022: 7 - 2021
- [c2]Alexandra Feeley, Yoni Xiong, Bharat L. Bhuva, Balaji Narasimham, Shi-Ji Wen, Rita Fung:
Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology. IRPS 2021: 1-5 - [c1]Yoni Xiong, Alexandra Feeley, Lloyd W. Massengill, Bharat L. Bhuva, Shi-Jie Wen, Rita Fung:
Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node. IRPS 2021: 1-5
Coauthor Index
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